Acoustic subsurface-atomic force microscopy: Three-dimensional imaging at the nanoscale

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dc.contributor.authorSharahi, Hossein J.
dc.contributor.authorJanmaleki, Mohsen
dc.contributor.authorTetard, Laurene
dc.contributor.authorKim, Seonghwan
dc.contributor.authorSadeghian, Hamed
dc.contributor.authorVerbiest, Gerard J.
dc.date.accessioned2021-02-18T00:55:25Z
dc.date.available2021-02-18T00:55:25Z
dc.date.issued2021-01
dc.description.abstractThe development of acoustic subsurface atomic force microscopy, which promises three-dimensional imaging with single-digit nanometer resolution by introduction of ultrasound actuations to a conventional atomic force microscope, has come a long way since its inception in the early 1990s. Recent advances provide a quantitative understanding of the different experimentally observed contrast mechanisms, which paves the way for future applications. In this perspective, we first review the different subsurface atomic force microscope modalities: ultrasonic force microscopy, atomic force acoustic microscopy, heterodyne force microscopy, mode-synthesizing atomic force microscopy, and near-field picosecond ultrasonic microscopy. Then, we highlight and resolve a debate existing in the literature on the importance of the chosen ultrasound excitation frequencies with respect to the resonance frequencies of the cantilever and the observed contrast mechanisms. Finally, we discuss remaining open problems in the field and motivate the importance of new actuators, near-field picosecond ultrasonics, and integration with other techniques to achieve multi-functional non-destructive three dimensional imaging at the nanoscale.en_US
dc.identifier.doihttp://dx.doi.org/10.1063/5.0035151en_US
dc.identifier.urihttp://hdl.handle.net/1880/113104
dc.identifier.urihttps://doi.org/10.11575/PRISM/46026
dc.language.isoengen_US
dc.publisher.departmentCentre for Bioengineering Research and Educationen_US
dc.publisher.departmentMechanical & Manufacturing Engineeringen_US
dc.publisher.facultySchulich School of Engineeringen_US
dc.publisher.hasversionacceptedVersionen_US
dc.publisher.institutionUniversity of Calgaryen_US
dc.publisher.institutionUniversity of Central Floridaen_US
dc.publisher.institutionEindhoven University of Technologyen_US
dc.publisher.institutionDelft University of Technologyen_US
dc.rightsUnless otherwise indicated, this material is protected by copyright and has been made available with authorization from the copyright owner. You may use this material in any way that is permitted by the Copyright Act or through licensing that has been assigned to the document. For uses that are not allowable under copyright legislation or licensing, you are required to seek permission.en_US
dc.subjectatomic force microscopyen_US
dc.subjectpicosecond ultrasonicsen_US
dc.subjectultrasounden_US
dc.subjecttip-sample interactionen_US
dc.subjectfrictionen_US
dc.subjectultrasound scatteringen_US
dc.subject2D materialsen_US
dc.subjectlife sciencesen_US
dc.subjectcompositesen_US
dc.subjectnanotechnologyen_US
dc.subjectthree-dimensional imagingen_US
dc.subject3D imagingen_US
dc.titleAcoustic subsurface-atomic force microscopy: Three-dimensional imaging at the nanoscaleen_US
dc.typejournal articleen_US
ucalgary.item.requestcopyfalseen_US
ucalgary.scholar.levelFacultyen_US
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