Atomic Scale Characterization of Graphitic Surfaces
Abstract
Characterization of materials at smaller scales is important for device miniaturization and understanding fundamental mechanics of materials at atomistic levels. In this thesis, characterization of graphitic surfaces was performed using various atomic force microscopy techniques. Tip convolution effects across graphite step edges were studied using amplitude-modulated atomic force microscopy and compared with molecular dynamics (MD) simulations for varying tip sizes. Larger step widths were observed for both experiments and simulations when compared with a geometric model of the system and was attributed to material deformation. Secondly, friction studies were performed on single layer graphitic surfaces grown on Pt(111) to observe the influence of structural changes at the graphene/Pt(111) interface on lubrication. Variation in measured lateral forces and average friction forces were observed for different graphene domains due to graphene/Pt(111) lattice mismatching. These results were compared to simulations performed within the framework of the Prandtl-Tomlinson (PT) model and through Molecular Statics.
Description
Keywords
Materials Science, Engineering--Mechanical
Citation
Chan, N. (2016). Atomic Scale Characterization of Graphitic Surfaces (Master's thesis, University of Calgary, Calgary, Canada). Retrieved from https://prism.ucalgary.ca. doi:10.11575/PRISM/25060